Directory of Scanning Probe Microscopy Resources

Home > Science > Methods and Techniques > Microscopy > Scanning Probe Microscopy

These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).

Resources in This Category

• ALB's Webpage

  http://alb42.de/
  Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.

• Conference on Non-Contact AFM

  http://www.ncafm.info/
  August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.

• Imaging Surfaces on a Fine Scale

  http://www.mobot.org/jwcross/spm/
  Description of techniques and applications.

• Modern Research and Educational Topics in Microscopy

  http://www.formatex.org/microscopy3/
  Online edition of this book edited by A Mendez-Vilas and J Diaz.

• Scanning Tunneling Microscopy

  http://www.almaden.ibm.com/vis/stm/
  Image gallery of metal surfaces, generated at the IBM Almaden Research Center in San Jose, CA.

• SPM Application

  http://www.chemistry.mcmaster.ca/kruse/
  Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.

• University of Leuven, Belgium - The SPM Group

  http://fys.kuleuven.be/vsm/spm/
  Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.

 

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